Electronic Engineering
102 subscribers
3 photos
1 file
27 links
Details About Journals and Their Review Procedures
Contact: @emriflaand
Download Telegram
Important Note:  If your manuscript is rejected by an IOP Publishing journal, it is strongly recommended that you do not submit it to another journal within the same publishing house.  IOP Publishing generally maintains a policy of rejecting manuscripts that have been previously rejected by one of their journals.
πŸ‘2
Title: An efficient design methodology for a tri-state multiplier circuit in carbon nanotube technology

Journal: Physica Scripta https://iopscience.iop.org/journal/1402-4896

Journal metrics: Q2 and IF=2.6


Accepted for publication

Review Process Summary:
Reviewers: 2
Revisions: 1 (Major)
Review comments: easy & addressable
Time to first decision: 82 days
Time to acceptance: 112 days
❀4πŸ‘1
Honoured to be featured among the top 2% of the highest cited researchers in ISC. Here's to pushing the boundaries of science further!
πŸ‘5❀3
Title: Synthesis of a CNTFET-Based Ternary Full Adder Using a Carry-Less Ternary Half Adder

journal: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
https://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=43


Accepted for publication
https://ieeexplore.ieee.org/document/11003064

Review Process Summary:
Reviewers: 3
Revisions: 1 (Major)
Review comments: easy & addressable
Time to first decision: 61 days
Time to acceptance: 94 days


P.S.:
I would like to extend my heartfelt thanks to Dr. A. Darabi for designing the circuit layout.
❀3πŸ‘2
Electronic Engineering
Title: Synthesis of a CNTFET-Based Ternary Full Adder Using a Carry-Less Ternary Half Adder journal: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems https://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=43 Accepted for…
Note:
When submitting your work to the IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, please be aware that a major revision may be requested. This is your final opportunity to make improvements. If the Associate Editor recommends another major revision, it will result in an automatic rejection of your submission. Therefore, it is essential to thoroughly address all comments and concerns with the utmost care and clarity.
❀2πŸ‘1
Title: Schmitt trigger based Low Leakage and Half-select free Near-threshold 10T SRAM Architecture

Journal:Journal of Circuits, Systems and Computers

Accepted for publication:
https://doi.org/10.1142/S0218126625503487


Review Process Summary:
Reviewers: 2
Revisions: 1
Review comments: easy & addressable
Time to acceptance:  60 days

P.S.:
I would like to express my gratitude to Dr. A.P. Kumar for the opportunity to contribute to his work.
❀5
🌟 Easily Download Images from Your PDF File!

πŸš€ Do you have a PDF file and wish to download its images separately? The website "I Love PDF" is the perfect solution for you!

⬅️ How to Do This:

1. Visit the link below and click on the "Select PDF Files" option to choose and upload your PDF file.

2. Select the "Extract Image" option, and finally click on "Convert to JPG" to easily obtain the images from your PDF file.

http://ilovepdf.com/pdf_to_jpg

Effortlessly extract your images and make use of them!
πŸ‘3
Title: A Stable, Low-Power SRAM Cell with Half-Select Immunity in CNTFET Technology

journal: AEUE - International Journal of Electronics and Communications
https://www.sciencedirect.com/journal/aeu-international-journal-of-electronics-and-communications

Accepted for publication:
https://www.sciencedirect.com/science/article/abs/pii/S1434841125002250?via%3Dihub

Review Process Summary:
Reviewers: 2
Revisions: 1 (Major)
Review comments: Addressable
Time to first decision: 30 days
Time to acceptance: 68 days
❀6
Title: A Power/Energy-Efficient 8T SRAM With Reduced Minimum Operation Voltage

journal: Physica Scripta
https://iopscience.iop.org/journal/1402-4896

Accepted for publication:
https://doi.org/10.1088/1402-4896/adf5fb

Review Process Summary:

Reviewers: 4 (Additional reviewers have been invited to evaluate the revised manuscript.)

Revisions: 2 (Major & Moderate)

Review comments: Addressable

Time to first decision: 23 days
Time to acceptance: 80 days
❀6
Title: A Soft Error Self-Resilience Radiation-Hardened 14T SRAM for Aerospace Applications

Journal: IEEE Access

Accepted for publication:
https://ieeexplore.ieee.org/document/11122867


Review Process Summary 1:

Reviewers: 2
Reject (updates required before resubmission)
Review comments: Addressable
Time to decision: 30 days

Review Process Summary 2:

Reviewers: 2
Time to acceptance: 21 days

P.S.:
I would like to express my gratitude to Dr. M.P. Kumar for the opportunity to contribute to his work.
❀6
Title: Comparative evaluation of robust low-power SRAM architectures

journal: Engineering Research Express
https://iopscience.iop.org/journal/2631-8695

Accepted for publication:
https://iopscience.iop.org/article/10.1088/2631-8695/adfeb5/meta

Review Process Summary:

Reviewers: 4

Revisions: 1 (Major)

Review comments: Addressable

Time to first decision: 41 days
Time to acceptance: 104 days
❀5
Title: A CNTFET-based 10T Static Memory Design Immune to Read and Half-Select Disturbs for Low-Power Wearable Biomedical Systems

Journal: IEEE Access

Accepted for publication:
https://ieeexplore.ieee.org/document/11175222

Review Process Summary 1:
Reviewers: 2
Reject (updates required before resubmission)
Review comments: Addressable
Time to decision: 26 days

Review Process Summary 2:
Reviewers: 2 (new reviewers)
Reject (updates required before resubmission)
Review comments: Addressable
Time to decision: 35 days

Review Process Summary 3:
Reviewers: 2
Time to acceptance: 18 days

P.S.:
I would like to extend my heartfelt thanks to Dr. A. Darabi for designing the circuit layout.
❀2
❀2πŸ‘2
Title: Energy-efficient Buffer-Based Ternary SRAM Cell with Application to Image Processing

Journal: IEEE Access

Accepted for publication:
https://ieeexplore.ieee.org/abstract/document/11184776

Review Process Summary 1:
Reviewers: 4
Reject (updates required before resubmission)
Review comments: Addressable
Time to decision: 55 days


Review Process Summary 2:
Reviewers: 2
Time to acceptance: 20 days
❀6
Title: Circuit-Level Analysis of a Novel Ternary Adder in Ternary-Enabled Graphene Nanoribbon FETs Technology

journal: Engineering Research Express
https://iopscience.iop.org/journal/2631-8695

Accepted for publication:
https://iopscience.iop.org/article/10.1088/2631-8695/ae1102

Review Process Summary:

Reviewers: 2

Revisions: 2 (Major & Minor)

Review comments: Addressable

Time to first decision: 59 days
Time to acceptance: 120 days
❀3πŸ‘2
Title: Overcoming Silicon MOSFET Limitations with Chirality-Engineered CNTFETs: A Ternary Half Adder Demonstration for Next-Generation Nanoelectronics

journal: Silicon
https://link.springer.com/journal/12633

Accepted for publication:
https://link.springer.com/article/10.1007/s12633-025-03551-w

Review Process Summary:

No. of Reviewers: 1 & 4

No. of Revisions: 2 (Minor)

Review comments: Addressable

Time to first decision: 3 months
Time to acceptance:  6 months
❀3
Title: Hybrid Cross-Coupled Inverter-Based 8T SRAM Design with Half-Selection Immunity and Enhanced Stability for Power-Constrained Applications

Journal: IEEE Access
https://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6287639

Accepted for publication:
https://ieeexplore.ieee.org/document/11272051

Review Process Summary 1:
Reviewers: 2
Reject (updates required before resubmission)
Review comments: Addressable
Time to decision: 71 days


Review Process Summary 2:
Reviewers: 4
Time to acceptance: 51 days
❀3πŸ‘1
Title: A low-power 9T SRAM with half-selection resilient in carbon nanotube field-effect transistor technology for battery-operated systems

journal: Physica Scripta
https://iopscience.iop.org/journal/1402-4896

Accepted for publication:
https://iopscience.iop.org/article/10.1088/1402-4896/ae2897

Review Process Summary:

Reviewers: 3

Revisions: 1 (Moderate)

Review comments: Easy & Addressable

Time to first decision: 35 days
Time to acceptance: 60 days
❀5
Title: Low Complexity, High-Performance Ternary Full Adder Using CNTFET Technology

journal: Arabian Journal for Science and Engineering (AJSE)
https://link.springer.com/journal/13369

Accepted for publication:
https://link.springer.com/article/10.1007/s13369-026-11068-6

Review Process Summary:

Reviewers: 1

Revisions: 1 (Minor)

Review comments: Easy & Addressable

Time to first decision: 180 days
Time to acceptance: 246 days
πŸ‘4
Title: An efficient ternary full adder design using carry-free ternary half adder and threshold detectors

journal: Scientific Reports https://www.nature.com/srep/

Accepted for publication: https://www.nature.com/articles/s41598-026-64479-8


Review Process Summary:

Reviewers: 3

Revisions: 1 (Major)

Review comments: Addressable

Time to first decision: 28 days
Time to acceptance: 42 days
❀2πŸ”₯1